Facilities

Light sources

  • AlGaAs diode laser (EL.EN. Mod. WELD 800, Italy): wavelength emission at 810 nm; 10 W maximum output power; pulsed or continuous wave emission mode,  equipped with a fiber optic

  • Optical Parametric Oscillator (OPO) pumped with the third harmonic of a Q-switched Nd:YAG laser (Continuum Surelite OPO plus, Santa Clara, USA): wavelength range 400-2500 nm, pulse duration 5 ns.

Microscopy

  • Atomic Force Microscope QUESANT EIU with scan modules QSCOPE 250 and USPM

  • Laser Scanning Confocal Microscope Leica SP8, equipped with four solid state lasers emitting at 405/488/552 and 638 nm, three independent detector channels and a large incubator for warm air incubation and CO2 control

  • Upright Confocal Raman Microscope HORIBA XploRA ONE, equipped with three solid state lasers emitting at 532, 639 and 785 nm, spectral range 100cm-1 to 3500cm-1, maximum lateral resolution 1 micron x1 micron

  • Inverted Microscope Leica DMI3000 B

  • Upright Microscope Leica DM2500

  • Stereomicroscope Nikon SMZ 1500, with zoom range from 0.75x to 11.25x

  • Takagi operating microscope

  • Internal access to CEME Electron Microscopy Facilities

Material characterization

  • Spectrophotometer Jasco V-560 (wavelength range 400-900 nm)

  • Cary Eclipse spectrofluorometer (Agilent Technologies, Cernusco sul Naviglio (MI), Italy)

  • Spectrometer Shimadzu 8300 ATR-FTIR

  • Differential Scanning Calorimeter DSC1 Mettler Toledo

  • Dynamic Light Scattering and Z-scan Malvern Mod. Zetasizer Nano ZS90

Other

  • Infrared Thermocamera Thermovision A20 FLIR System Inc.

  • Ultrasound instrumentation: pre-amplified needle hydrophones  Precision Acoustics, Dorset, UK  with sensor diameter 1 mm and 0.2 mm, frequency range 1-20 MHz, a manually controlled ultrasonic pulser-receiver Olympus 5077PR, with 35 MHz (-3 dB) bandwidth and square wave, Olympus immersion transducers with frequencies ranging from 1 MHz to 10 MHz

  • Plasma Cleaner Diener ZEPTO